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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2021-10-20T02:31:56Z Reliability of using foot-worn devices to measure gait parameters in people with Parkinson's disease YA-YUN LEE; Li, Min-Hao; Luh, Jer-Junn; Tai, Chun-Hwei
臺大學術典藏 2021-11-30T03:31:01Z Reliability of using foot-worn devices to measure gait parameters in people with Parkinson's disease Lee Y.-Y.; Li M.-H.; Luh J.-J.; CHUN-HWEI TAI
臺大學術典藏 2021-09-14T23:18:50Z Reliability of using foot-worn devices to measure gait parameters in people with Parkinson's disease YA-YUN LEE; Li, Min Hao; JER-JUNN LUH; CHUN-HWEI TAI
臺大學術典藏 2018-09-10T08:32:07Z Reliability of Ventricular Function Measured by Novel CZT-based Gated Thallium-201 Myocardial Perfusion Single Photon Emission Computed Tomography: compared with 2-dimentional echocardiography. RUOH-FANG YEN; RUOH-FANG YEN
國立臺灣大學 2003 Reliability on the Measurements of Lower Extremity Passive Range of Motion and Postural Assessment in Nursing Home Residents 李曉惠; 林光華; 胡名霞; LEE, HSIAO-HUI; LIN, KWAN-HWA; HU, MING-HSIA
國立臺灣大學 2001-01 Reliability on the measurements of pressure pain threshold on tender points of muscles Wang, SF; Chen, YC; Lai, IM; Liao, WS
國立臺灣科技大學 2009 Reliability optimization for a computer network under double-components allocations subject to allocation budget Lin, Yi-Kuei; Yeh, Cheng-Ta
國立臺灣科技大學 2011 RELIABILITY OPTIMIZATION OF COMPONENT ASSIGNMENT PROBLEM FOR A MULTISTATE NETWORK IN TERMS OF MINIMAL CUTS Lin, Y.K.;Yeh, C.T.
國立交通大學 2014-12-08T15:03:33Z RELIABILITY OPTIMIZATION OF DISTRIBUTED COMPUTING SYSTEMS SUBJECT TO CAPACITY CONSTRAINTS CHEN, RS; CHEN, DJ; YEH, YS
東海大學 1994-07-00 Reliability Optimization of Series Systems in Two Different Layouts 王文清;呂俊德
國立成功大學 2003-09 Reliability polynomials and their asymptotic limits for families of graphs Chang, Shu-Chiuan; Shrock, �Robert
義守大學 2006 Reliability prediction for 95.5Sn3.9Ag0.6Cu solder bump and thermal design for lead free system in package with polymer-based material Hsiang-Chen Hsu;Wei-Mao Hung
國立交通大學 2014-12-08T15:27:42Z Reliability prediction of degraded structures via a statistical system identification approach KAM, TY; LEE, TY
國立成功大學 1998-04 Reliability prediction of imperfect switching systems subject to Weibull failures Pan, Jeh-Nan
國立交通大學 2014-12-08T15:22:31Z Reliability Properties and Current Conduction Mechanisms of HfO2 MIS Capacitor with Dual Plasma Treatment Chang, Kow-Ming; Chang, Ting-Chia; Chen, Shou-Hsien; Deng, I-Chung
淡江大學 2023-08 Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring Wu, Shu-Fei;Cheng, Yi-Wun;Kang, Che-Wei;Chang, Wei-Tsung
淡江大學 2023-09-13 Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring Wu, S. F.;Cheng, Y. W.;Kang, C. W.;Chang, W. T.
淡江大學 2021-08-31 Reliability sampling design for the lifetime performance index of Gompertz lifetime distribution under progressive type I interval censoring Wu, S. F.;Xie, Y. J.;Liao, M. F.;Chang, W. T.
淡江大學 2008-10 Reliability sampling plans for Weibull distribution with limited capacity of test facility 蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye
國立成功大學 2008-10 Reliability sampling plans for Weibull distribution with limited capacity of test facility Tsai, Tzong-Ru; Lu, Yu-Ting; Wu, Shuo-Jye
淡江大學 2008-09-01 Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions Huang, Syuan-Rong; Wu, Shuo-Jye
淡江大學 2008-09-04 Reliability sampling plans under progressive type-I interval censoring using cost functions Huang, S.-R.;Wu, S.-J.
淡江大學 2012-12 Reliability sampling plans under progressively first-failure censored in presence of cost constraint 黃炫融; 吳碩傑
臺大學術典藏 2018-09-10T08:14:25Z Reliability screening of a-Si TFT circuits: Very-low voltage and I DDQ Testing Shen, S.-T.;Liu, C.;Ma, E.-H.;Cheng, I.-C.;Li, J.C.-M.; Shen, S.-T.; Liu, C.; Ma, E.-H.; Cheng, I.-C.; Li, J.C.-M.; I-CHUN CHENG; CHIEN-MO LI
國立交通大學 2014-12-08T15:04:18Z RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C WU, CC; TAI, K; HAUNG, KF

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