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Showing items 722156-722180 of 2349128 (93966 Page(s) Totally)
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| 國立成功大學 |
2003-09 |
Reliability polynomials and their asymptotic limits for families of graphs
|
Chang, Shu-Chiuan; Shrock, �Robert |
| 義守大學 |
2006 |
Reliability prediction for 95.5Sn3.9Ag0.6Cu solder bump and thermal design for lead free system in package with polymer-based material
|
Hsiang-Chen Hsu;Wei-Mao Hung |
| 國立交通大學 |
2014-12-08T15:27:42Z |
Reliability prediction of degraded structures via a statistical system identification approach
|
KAM, TY; LEE, TY |
| 國立成功大學 |
1998-04 |
Reliability prediction of imperfect switching systems subject to Weibull failures
|
Pan, Jeh-Nan |
| 國立交通大學 |
2014-12-08T15:22:31Z |
Reliability Properties and Current Conduction Mechanisms of HfO2 MIS Capacitor with Dual Plasma Treatment
|
Chang, Kow-Ming; Chang, Ting-Chia; Chen, Shou-Hsien; Deng, I-Chung |
| 淡江大學 |
2023-08 |
Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring
|
Wu, Shu-Fei;Cheng, Yi-Wun;Kang, Che-Wei;Chang, Wei-Tsung |
| 淡江大學 |
2023-09-13 |
Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring
|
Wu, S. F.;Cheng, Y. W.;Kang, C. W.;Chang, W. T. |
| 淡江大學 |
2021-08-31 |
Reliability sampling design for the lifetime performance index of Gompertz lifetime distribution under progressive type I interval censoring
|
Wu, S. F.;Xie, Y. J.;Liao, M. F.;Chang, W. T. |
| 淡江大學 |
2008-10 |
Reliability sampling plans for Weibull distribution with limited capacity of test facility
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蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye |
| 國立成功大學 |
2008-10 |
Reliability sampling plans for Weibull distribution with limited capacity of test facility
|
Tsai, Tzong-Ru; Lu, Yu-Ting; Wu, Shuo-Jye |
| 淡江大學 |
2008-09-01 |
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
|
Huang, Syuan-Rong; Wu, Shuo-Jye |
| 淡江大學 |
2008-09-04 |
Reliability sampling plans under progressive type-I interval censoring using cost functions
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Huang, S.-R.;Wu, S.-J. |
| 淡江大學 |
2012-12 |
Reliability sampling plans under progressively first-failure censored in presence of cost constraint
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黃炫融; 吳碩傑 |
| 臺大學術典藏 |
2018-09-10T08:14:25Z |
Reliability screening of a-Si TFT circuits: Very-low voltage and I DDQ Testing
|
Shen, S.-T.;Liu, C.;Ma, E.-H.;Cheng, I.-C.;Li, J.C.-M.; Shen, S.-T.; Liu, C.; Ma, E.-H.; Cheng, I.-C.; Li, J.C.-M.; I-CHUN CHENG; CHIEN-MO LI |
| 國立交通大學 |
2014-12-08T15:04:18Z |
RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C
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WU, CC; TAI, K; HAUNG, KF |
| 國立交通大學 |
2014-12-08T15:04:10Z |
RELIABILITY STUDIES OF GAIN-GUIDED 0.85 MU-M GAAS/ALGAAS QUANTUM-WELL SURFACE-EMITTING LASERS
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WU, CC; TAI, K; HUANG, TC; HUANG, KF |
| 南台科技大學 |
2005 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
C. W. Yang; Y. K. Fang; S. F. Chen; C. S. Lin; C. Y. Lin; W. D. Wang; T. H. Chou; P. J. Lin; M. F. Wang; T. H. Hou; L. G. Yao; S. C. Chen; M. S. Liang;陳世芳;陳順智 |
| 國立成功大學 |
2005-10 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J. |
| 臺大學術典藏 |
2018-09-10T05:56:14Z |
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
|
Ejeckam, FE;Chua, CL;Zhu, Z-H;Lo, YH;Hong, Mingyi;Mannaerts, JP;Bhat, Ritesh; Ejeckam, FE; Chua, CL; Zhu, Z-H; Lo, YH; Hong, Mingyi; Mannaerts, JP; Bhat, Ritesh; MINGHWEI HONG |
| 亞洲大學 |
2012 |
Reliability Study of AlN Passivation Effects on AlGaN/GaN HEMT Using Fully-Coupled Self-Consistent Electro-Thermo-Mechanical Analysis
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Prabowo, Briliant Adhi |
| 亞洲大學 |
2011 |
Reliability Study of High Resistive N-drift Region LDMOS Device
|
Min-Chin Tsai |
| 亞洲大學 |
2010 |
Reliability Study of High Voltage Devices
|
Aloysius Priartanto |
| 國立交通大學 |
2017-04-21T06:55:41Z |
Reliability study of high-k La2O3/HfO2 and HfO2/La2O3 stacking layers on n-In0.53Ga0.47As metal-oxide-semiconductor capacitor
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Chu, Chung-Ming; Lin, Yueh-Chin; Lee, Wei-I; Dee, Chang Fu; Wong, Yuen-Yee; Majlis, Burhanuddin Yeop; Salleh, Muhamad Mat; Yap, Seong Ling; Chang, Edward Yi |
| 國立交通大學 |
2017-04-21T06:49:39Z |
Reliability study of InGaP/GaAs HBT for 28V operation
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Chau, Frank Hin-Fai; Lin, Barry Jia-Fu; Chen, Yan; Kretschmar, Mark; Lee, Chien-Ping; Wang, Nan-lei Larry; Sun, Xiaopeng; Ma, Wenlong; Xu, Sarah; Hu, Peter |
| 國立成功大學 |
2011 |
Reliability Study of Ink on Stress in Single Lap Adhesive Joints
|
Yen, Yu-Tang;Fang, Te-Hua;Lin, Yu-Cheng |
Showing items 722156-722180 of 2349128 (93966 Page(s) Totally)
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