| 國立臺灣大學 |
2005 |
Reliability Study of Lymphedema Measurement
|
蔡涵如; 曹昭懿; TSAI, HAN-JU; TSAUO, JAU-YIH |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Reliability Study of MANOS with and without a SiO2 Buffer Layer and BE-MANOS Charge-Trapping NAND Flash Devices
|
Liao, Chien-Wei; Lai, Sheng-Chih; Lue, Hang-Ting; Yang, Ming-Jui; Shen, Chin-Yen; Lue, Yi-Hsien; Huang, Yu-Fong; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立臺灣大學 |
2008-01 |
Reliability Study of Measurements for Lymphedema in Breast Cancer Patients
|
Chen, YW; Tsai, HJ; Hung, HC; Tsauo, JY |
| 臺大學術典藏 |
2020-06-26T07:31:54Z |
Reliability study of measurements for lymphedema in breast cancer patients
|
Chen Y.-W.;Tsai H.-J.;Hung H.-C.;Jau-Yih Tsauo; Chen Y.-W.; Tsai H.-J.; Hung H.-C.; JAU-YIH TSAUO |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
|
張淙旻?; Chang, TM |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
|
林式庭?; Lin, ST |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
|
吳幼麟?; Wu, YL |
| 亞洲大學 |
2012 |
Reliability Study On 5V BCD CMOS Device: New PMOS-NBTI Characterization And HCI Assessment On NMOS Bend Gate Structure
|
AMETHYSTNA, SURYA KRIS |
| 國立交通大學 |
2017-04-21T06:49:11Z |
Reliability Study on Tri-Gate Nanowires Poly-Si TFTs under DC and AC Hot-Carrier Stress
|
Wu, Yung-Chun; Chen, Hung-Bin; Feng, Li-Wei; Chang, Ting-Chang; Liu, Po-Tsun; Chang, Chun-Yen |
| 亞洲大學 |
2012 |
Reliability test of high voltage SOI device under Hot carrier injection stress
|
Magsarsuren, Luvsanperenlei |
| 臺大學術典藏 |
2019-06-26T07:04:18Z |
Reliability test of LED driven by PWM technique
|
Chen K.Y.; Chen J.W.; Hsu P.C.; Tang C.W.; Wu M.S.; Chen K.Y.;Chen J.W.;Hsu P.C.;Tang C.W.;Wu M.S.;Huang B.J.; Huang B.J. |
| 國立成功大學 |
2014-06 |
Reliability testing in GaN-based blue light-emitting diodes by doping TiO2 nanoparticles into silicone encapsulation
|
Wang, Pin-Chao; Lin, Chun-Liang; Su, Yan-Kuin; Chien, Pei-Ching; Yeh, Yung-Hsiang; Liou, Jhong-Kai; Wei, Chi-Min |
| 元智大學 |
2016-10-26 |
Reliability Testing of Au/Pd/Cu and Au/Pd(P)/Cu Surface Finishes at High Temperature Storage
|
Cheng-En Ho; Wan-Zhen Hsieh; Pei-Tzu Lee; Tsai-Tung Kuo |
| 元智大學 |
2014-10-31 |
Reliability testing of flexible four-in-one micro sensor
|
Chi-Yuan Lee; Chia-Hung Chen; Shyong Lee; Ten-Lom Chen; Yen-Ting Huang |
| 元智大學 |
2014-10-31 |
Reliability testing of flexible four-in-one micro sensor
|
Chi-Yuan Lee; Chia-Hung Chen; Shyong Lee; Ten-Lom Chen; Yen-Ting Huang |
| 元智大學 |
2014-10-31 |
Reliability testing of flexible four-in-one micro sensor
|
Chi-Yuan Lee; Chia-Hung Chen; Shyong Lee; Ten-Lom Chen; Yen-Ting Huang |
| 臺大學術典藏 |
2018-09-10T15:22:47Z |
Reliability tests of ionic polymer metallic composites in dry air for actuator applications
|
Yu, C.-Y.;Zhang, Y.-W.;Su, G.-D.J.; Yu, C.-Y.; Zhang, Y.-W.; Su, G.-D.J.; GUO-DUNG JOHN SU |
| 亞洲大學 |
2005 |
Reliability Verification of Microarray Gene Expression Database
|
C.W. LIANG |
| 亞洲大學 |
2005-05 |
Reliability Verification of Microarray Gene Expression Database
|
蔡進發;Jeffrey, J.P.Tsai |
| 亞洲大學 |
2005.05 |
Reliability Verification of Microarray Gene Expression Database
|
C.W.Leung;C.W.Leung;R.M.Chen;R.M.Chen;R.M.Fu;R.M.Fu;K.C.Shih;K.C.Shih;I.C.Wang;I.C.Wang;M.I.Lee;M.I.Lee;蔡進發;Jeffrey, J.P.Tsai;C.K.Chang;C.K.Chang |
| 國立中山大學 |
2003 |
Reliability worth assessment of high tech industry
|
S.A. Yin; R.F. Chang; C.N. Lu |
| 國立交通大學 |
2017-04-21T06:49:52Z |
Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits
|
Schlichtmann, Ulf; Hashimoto, Masanori; Jiang, Iris Hui-Ru; Li, Bing |
| 臺大學術典藏 |
2022-05-24T06:20:37Z |
Reliability, reproducibility and validity of dynamic cerebral autoregulation in a large cohort with transient ischaemic attack or minor stroke
|
Lee Y.-K.;Rothwell P.M.;Payne S.J.;Webb A.J.S.; Lee Y.-K.; Rothwell P.M.; Payne S.J.; Webb A.J.S.; STEPHEN JOHN PAYNE |
| 國立臺灣大學 |
1992 |
Reliability, Resiliency, and Vulnerability Analysis of a Reservoir System by Stochsatic Simulation
|
Wan, S.; 郭振泰; Wan, S.; Kuo, Jan-Tai |
| 臺大學術典藏 |
2020-04-08T07:35:08Z |
Reliability, sensitivity to change, and responsiveness of the Peabody Developmental Motor Scales-Second Edition for children with cerebral palsy
|
Wang H.-H.;Liao H.-F.;Ching-Lin Hsieh; Wang H.-H.; Liao H.-F.; CHING-LIN HSIEH |
