|
|
???tair.name??? >
???browser.page.title.title???
|
Showing items 378976-379000 of 2349123 (93965 Page(s) Totally)
<< < 15155 15156 15157 15158 15159 15160 15161 15162 15163 15164 > >>
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:43:27Z |
Electrical characteristics of thin cerium oxide film on silicon substrate by reactive DC sputtering
|
Pan, TM; Chien, CH; Lei, TF; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:36:22Z |
Electrical characteristics of thin HfO(2) gate dielectrics prepared using different pre-deposition surface treatments
|
Chen, CW; Chien, CH; Perng, TH; Yang, MJ; Liang, JS; Lehnen, P; Tsui, BY; Chang, CY |
| 國立交通大學 |
2019-04-02T06:00:17Z |
Electrical characteristics of thin HfO2 gate dielectrics prepared using different pre-deposition surface treatments
|
Chen, CW; Chien, CH; Perng, TH; Yang, MJ; Liang, JS; Lehnen, P; Tsui, BY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:03:33Z |
ELECTRICAL CHARACTERISTICS OF THIN-FILM TRANSISTORS WITH DOUBLE-ACTIVE-LAYER STRUCTURE
|
TSAI, MJ; WANG, PW; SU, HP; CHENG, HC |
| 國立臺灣大學 |
2004 |
Electrical characteristics of ultra-thin gate oxides (<3 nm) prepared by direct current superimposed with alternating-current anodization
|
Chen, Zhi-Hao; Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立聯合大學 |
2004 |
Electrical Characteristics of Ultra-thin Gate Oxides (<3nm) Prepared by Direct Current Superposed with Alternating-current Anodization
|
胡振國, Z.H.Chen, S.W.Huang, and J.G.Hwu |
| 臺大學術典藏 |
2018-09-10T04:11:33Z |
Electrical characteristics of ultrathin Pt/Y 2 O 3/Si capacitor with rapid post-metallisation annealing
|
Lay, TS;Liu, WD;Kwo, J;Hong, M;Mannaerts, JP; Lay, TS; Liu, WD; Kwo, J; Hong, M; Mannaerts, JP; MINGHWEI HONG |
| 國立中山大學 |
2002 |
Electrical characteristics of ultrathin Pt/Y2O3/Si capacitor with rapid post-metallization annealing
|
T.S. Lay;W.D. Liu;J. Kwo;M. Hong;J.P. Mannaerts |
| 臺大學術典藏 |
2019-12-27T07:49:53Z |
Electrical characteristics of ultrathin Pt/Y2O3/Si capacitor with rapid post-metallisation annealing
|
Lay, T.S.;Liu, W.D.;Kwo, J.;Hong, M.;Mannaerts, J.P.; Lay, T.S.; Liu, W.D.; Kwo, J.; Hong, M.; Mannaerts, J.P.; MINGHWEI HONG |
| 國立交通大學 |
2014-12-08T15:04:21Z |
ELECTRICAL CHARACTERISTICS OF WO3-BASED CO2-SENSITIVE SOLID-STATE MICROSENSOR
|
CHAO, S |
| 國立交通大學 |
2014-12-08T15:32:15Z |
Electrical Characterization and Materials Stability Analysis of La2O3/HfO2 Composite Oxides on n-In0.53Ga0.47As MOS Capacitors With Different Annealing Temperatures
|
Lin, Yueh Chin; Trinh, Hai Dang; Chuang, Ting Wei; Iwai, Hiroshi; Kakushima, Kuniyuki; Ahmet, Parhat; Lin, Chun Hsiung; Diaz, Carlos H.; Chang, Hui Chen; Jang, Simon M.; Chang, Edward Yi |
| 國立臺灣大學 |
2003 |
Electrical Characterization and Process Control of Cost Effective High-k Aluminum Oxide Gate Dielectrics Prepared by Anodization Followed by Furnace Annealing
|
Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立交通大學 |
2014-12-08T15:20:45Z |
Electrical characterization and Raman spectroscopy of individual vanadium pentoxide nanowire
|
Shen, W. -J.; Sun, K. W.; Lee, C. S. |
| 國立中山大學 |
1997 |
Electrical characterization and signal integrity of ball grid array packages
|
T.S. Horng;S.M. Wu;M.J. Kuo |
| 國立交通大學 |
2014-12-08T15:07:41Z |
Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
|
Shiu, Jin-Yu; Lu, Chung-Yu; Su, Ting-Yi; Huang, Rong-Tan; Zirath, Herbert; Rorsman, Niklas; Chang, Edward Yi |
| 國立臺灣海洋大學 |
2010-02 |
Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
|
Jin-Yu Shiu; Chung-Yu Lu; Ting-Yi Su; R. T. Huang; Herbert Zirath; Niklas Rorsman; Edward Yi Chang |
| 國立交通大學 |
2014-12-08T15:33:42Z |
Electrical Characterization of Al(2)O(3)/n-InAs Metal-Oxide-Semiconductor Capacitors With Various Surface Treatments
|
Trinh, H. D.; Brammertz, G.; Chang, E. Y.; Kuo, C. I.; Lu, C. Y.; Lin, Y. C.; Nguyen, H. Q.; Wong, Y. Y.; Tran, B. T.; Kakushima, K.; Iwai, H. |
| 國立交通大學 |
2014-12-08T15:46:38Z |
Electrical characterization of Al2O3 on Si from thermally oxidized AlAs and Al
|
Liao, CC; Chin, A; Tsai, C |
| 國立交通大學 |
2019-04-02T05:58:46Z |
Electrical Characterization of Al2O3/n-InAs Metal-Oxide-Semiconductor Capacitors With Various Surface Treatments
|
Trinh, H. D.; Brammertz, G.; Chang, E. Y.; Kuo, C. I.; Lu, C. Y.; Lin, Y. C.; Nguyen, H. Q.; Wong, Y. Y.; Tran, B. T.; Kakushima, K.; Iwai, H. |
| 臺大學術典藏 |
2018-09-10T04:53:28Z |
Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement
|
Lin, G.-R.;Chen, W.-C.;Chang, C.-S.;Pan, C.-L.; Lin, G.-R.; Chen, W.-C.; Chang, C.-S.; Pan, C.-L.; GONG-RU LIN |
| 臺大學術典藏 |
2020-06-11T06:38:11Z |
Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement
|
Lin, G.-R.;Chen, W.-C.;Chang, C.-S.;Pan, C.-L.; Lin, G.-R.; Chen, W.-C.; Chang, C.-S.; Pan, C.-L.; GONG-RU LIN |
| 國立交通大學 |
2014-12-08T15:03:39Z |
ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT
|
LIN, GR; CHEN, WC; CHANG, CS; PAN, CL |
| 國立交通大學 |
2014-12-08T15:12:24Z |
Electrical characterization of bathophenanthroline doped with dipotassium phthalate
|
Hsieh, Ming-Ta; Chang, Chan-Ching; Chen, Jenn-Fang; Ho, Meng-Huan; Chen, Teng-Ming; Chen, Chao-Jung; Chen, Chin H. |
| 義守大學 |
2002-12 |
Electrical characterization of BGA test socket for high-speed applications
|
Ming-Kun Chen;Cheng-Chi Tai;Yu-Jung Huang;Li-Kuei Fang |
| 義守大學 |
2006-10 |
Electrical characterization of FCBGA package based on measurement approach for high-speed SOC applications
|
Ming-Kun Chen;Cheng-Chi Tai;Yu-Jung Huang |
Showing items 378976-379000 of 2349123 (93965 Page(s) Totally)
<< < 15155 15156 15157 15158 15159 15160 15161 15162 15163 15164 > >>
View [10|25|50] records per page
|
